Researchers from the NIST in the US have found that short, weak energy pulses can be used to change RRAM states. This method is much more efficient and reliably than current switching techniques.
The researchers explain that current RRAM devices use single relatively high-energy pulses in order to switch the state (on / off, or 1 / 0). This is an unreliable method. The researchers have now discovered that short pulses (only 100 picoseconds in total), even very weak ones, are useful to switch the state.
The short pulses also reduce the variability. This is not eliminated, so several pulses may be necessary. Each pulse can also check if it the bit has been switched or not. The method also reduces the overlapping issue significantly.