Leti researchers look into RRAM endurance, window margin and retention

Researchers from Leti presented a new paper that clarified for the first time the correlation between endurance, window margin and retention of RRAM. The researchers advice ways module these three key properties, in different RRAM types.

Each RRAM type and base material has a different "sweet spot" that offers the best performance in all three categories. Using modelling the researchers were able to address various non-volatile memory applications, targeting high speed, high endurance or high stability.

The Leti team simulated four different RRAM materials, and then fabricated these on a 1T1R base wafer. The chips featured high endurance and high window margin.

Posted: Dec 10,2016 by Ron Mertens