Researchers from the NIST in the US have found that short, weak energy pulses can be used to change RRAM states. This method is much more efficient and reliably than current switching techniques.
The researchers explain that current RRAM devices use single relatively high-energy pulses in order to switch the state (on / off, or 1 / 0). This is an unreliable method. The researchers have now discovered that short pulses (only 100 picoseconds in total), even very weak ones, are useful to switch the state.